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Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications
by Cataldo, Andrea.
Publication:
. XVIII, 150 p.
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(1),
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Optical Measurement of Surface Topography
by Leach, Richard.
Publication:
. XIV, 326p. 231 illus., 42 illus. in color.
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Photo-Excited Charge Collection Spectroscopy
by Im, Seongil.
Publication:
. XI, 101 p. 61 illus.
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The Mie Theory
by Hergert, Wolfram.
Publication:
. XIV, 259 p. 78 illus., 56 illus. in color.
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(1),
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Semiconductor Research
by Patane, Amalia.
Publication:
. XIX, 372p. 192 illus., 38 illus. in color.
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(1),
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